Probe card

摘要

To provide a probe card that is used when carrying out electrical inspection of a high-density fine circuit board to be measured.;A probe card has plural probe pins, an insulator having plural through-holes through which the probe pins pass, and a pair of substrates that are positioned at both sides of the insulator and that have supporting holes into which end portions of the probe pins are inserted respectively. The pair of substrates and the insulator are provided so as to be slidable. One substrate is formed of a material having a same value as or an approximate value of a coefficient of thermal expansion of a fine circuit board to be measured, and another substrate is formed of a material having a same value as or an approximate value of a coefficient of thermal expansion of a wiring board for signal input/output.;By doing so, even if the fine circuit board to be measured and the wiring board for signal input/output thermally expand, the probe pins can always be made to contact the respective electrodes of the fine circuit board to be measured and the wiring board for signal input/output, and the probe pins that are adjacent do not short circuit. Therefore, electrical inspection of a high-density fine circuit board to be measured can be carried out at one time, and furthermore, precisely.

主权项

1. A probe card comprising:
a plurality of probe pins that are elastic and that have first end portions that electrically contact electrodes of a fine circuit board to be measured, and second end portions that electrically contact electrodes of a wiring board for signal input/output; an insulator that has a plurality of through-holes through which the probe pins pass respectively; and a first substrate and a second substrate that are respectively positioned at both sides of the insulator, the first substrate having supporting holes into which the first end portions of the probe pins are inserted, and the second substrate having supporting holes into which the second end portions of the probe pins are inserted, wherein the first substrate and the second substrate are provided so as to be able to slide with the insulator, the first substrate is formed of a material having a same value as or an approximate value of a coefficient of thermal expansion of the fine circuit board to be measured, and the second substrate is formed of a material having a same value as or an approximate value of a coefficient of thermal expansion of the wiring board for signal input/output, and wherein each of the plurality of probe pins includes first and second wave-shaped end portions, and each of the plurality of probe pins is supported due to the first and second wave-shaped end portions abutting and being stopped at the supporting holes of the first substrate and the second substrate, respectively.