| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection apparatus and the like capable of performing inspection with high inspection accuracy than conventional ones for a printed matter.SOLUTION: A high resolution inspection unit detects a defect candidate in an inspection target region on the basis of a portion of an inspection image extracted from the inspection image and a reference image. A low resolution inspection unit detects a defect in the inspection target region on the basis of each low resolution inspection image obtained by reducing the inspection image to a low resolution and a low resolution reference image obtained by reducing the reference image to the low resolution. The high resolution inspection unit delivers defect candidate information regarding the detected defect candidate to the low resolution inspection unit. The low resolution inspection unit performs an additional inspection on the defect candidate on the basis of the received defect candidate information. |
