发明名称 METHOD OF DETERMINING BONDING TEMPERATURE CONDITION OF ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide a method of determining a bonding temperature condition of an electronic component capable of easily determining a bonding temperature condition at thermocompression bonding of the electronic component.SOLUTION: A method of determining a bonding temperature condition of an electronic component at the time when the electronic component is thermocompression-bonded to an adherend while interposing an adhesive film, includes: a bonding temperature determination material selection step S11 of selecting a plurality of bonding temperature determination materials that have different melting temperatures; a pattern formation step S12 of forming a pattern by the selected bonding temperature determination materials, that can be confirmed visually, on any one of respective opposed surfaces of the electronic component and the adherend; a thermocompression bonding step S13 of thermocompression-bonding the electronic component to the adherend after the formation of the pattern; a molten state determination step S14 of determining a molten state of the pattern by the bonding temperature determination materials after the thermocompression bonding; and a bonding temperature determination step S15 of determining a bonding temperature at the thermocompression bonding on the basis of the determination result.
申请公布号 JP2015191928(A) 申请公布日期 2015.11.02
申请号 JP20140066144 申请日期 2014.03.27
申请人 DEXERIALS CORP 发明人 ITO MASAHIRO
分类号 H05K3/32;H01L21/60;H05K3/36 主分类号 H05K3/32
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