| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device that measures a temperature change of a structure to be inspected caused by infrared radiation so as to inspect internal defects while moving along the structure, and that compares an absorption spectrum obtained by irradiating the structure with an infrared ray to an absorption spectrum obtained by irradiating a normal substance with the infrared ray so as to inspect a deterioration state of the structure.SOLUTION: An inspection device comprises: an inspection device body 1; self-traveling mechanism 2 that makes the inspection device body 1 movable along a structure to be inspected; and calibration substance storage body 3 that is made movable in synchronism with the inspection device body 1, and that stores a normal substance used as a reference in measuring a deterioration state of the structure. The inspection device body 1 includes: an infrared irradiation part for irradiating the structure with an infrared ray for heating; a part for measuring a temperature change and a deterioration state that measures a temperature change of the structure caused by the irradiation of the infrared ray for heating, and that measures a deterioration state of the structure using an absorption spectrum obtained by spectrally separating an infrared ray from the structure heated by the infrared irradiation; and a drive control and accumulation part that performs drive control and data accumulation on the infrared irradiation part and the part for measuring a temperature change and a deterioration state. |
