发明名称 A METHOD AND SYSTEM FOR PATTERNING A MASK LAYER
摘要 The presently described embodiments use a printing process, e.g. a wax printing technique, to pattern a mask layer (such as a soldermask layer) of, for example, a printed circuit. Substantially all other conventional processes in developing soldermask and exposure processes can be maintained. According to the presently described embodiments, each printed circuit will have a unique pattern that matches uniform and non-uniform runout. In one form, the pattern is comprised of wax single drops having a specified gap to make the process transparent to the current industry practice. Furthermore, the single drops can be used for both large and small areas without any development time differences. In at least one form, the wax pattern and the soldermask in the gap are removed during development.
申请公布号 SG10201508031Q(A) 申请公布日期 2015.10.29
申请号 SG10201508031Q 申请日期 2008.03.31
申请人 PALO ALTO RESEARCH CENTER INCORPORATED 发明人 SCOTT J. LIMB;ERIC J. SHRADER;UMA SRINIVASAN
分类号 G03F1/00;G03F7/20;H05K3/00;H05K3/28 主分类号 G03F1/00
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