发明名称 TEST CASE GENERATION PROGRAM, TEST CASE GENERATION DEVICE, AND TEST CASE GENERATION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To extract a path capable of improving the inspection quality of an inspection target program and corresponding to fewer test cases from the inspection target program.SOLUTION: A test case generation device 10 comprises: an extraction unit 12; an aggregation unit 14; an acquisition unit 16; and a generation unit 20. The extraction unit 12 extracts a path condition for every path realizing the coverage of branches extracted from an inspection target program 22, and extracts a conditional equation (individual conditional equation) contained in the path condition. The aggregation unit 14 aggregates the individual conditional equations (atomic formulas). The acquisition unit 16 acquires, from combinations of truth-values of the atomic formulas, a combination of truth-values that do not represent any of path conditions extracted by the extraction unit 12 and that do not contradict combinations of truth-values of the respective atomic formulas, and acquires expansion path conditions obtained by adding a new path condition corresponding to the acquired combination of the truth-values of the atomic formula to the path conditions extracted by the extraction unit 12. The generation unit 20 generates a test case 24 corresponding to each of the expansion path conditions.</p>
申请公布号 JP2015187756(A) 申请公布日期 2015.10.29
申请号 JP20140064293 申请日期 2014.03.26
申请人 FUJITSU LTD 发明人 UEHARA TADAHIRO;MAEDA YOSHIHARU;KATAYAMA ASAKO;MUNAKATA KAZUKI;TOKUMOTO SUSUMU;FUJIWARA SHOICHIRO;SASAKI YUSUKE;SUPASIT MONPRATARNCHAI
分类号 G06F11/28 主分类号 G06F11/28
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