发明名称 SEMICONDUCTOR STRUCTURE AND FABRICATING METHOD THEREOF
摘要 A semiconductor structure and a method for fabricating the same are provided. The semiconductor structure includes a wafer substrate having a top surface and a bottom surface, and a conductive pillar in the wafer substrate defined by a deep trench insulator through the top surface and the bottom surface of the wafer substrate. The method for fabricating the semiconductor structure includes following steps. A deep trench is formed from a top surface of a wafer substrate to define a conductive region in the wafer substrate. The conductive region is doped with a dopant. The deep trench is filled with an insulation material to form a deep trench insulator. And the wafer substrate is thinned from a bottom surface of the wafer substrate to expose the deep trench insulator and isolate the conductive region to form a conductive pillar.
申请公布号 US2015311140(A1) 申请公布日期 2015.10.29
申请号 US201414262582 申请日期 2014.04.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 KALNITSKY Alexander;TUAN Hsiao-Chin;HUANG Shih-Fen;CHENG Hsin-Li;TSUI Felix Ying-Kit
分类号 H01L23/48;H01L21/265;H01L21/22;H01L21/768 主分类号 H01L23/48
代理机构 代理人
主权项
地址 Hsinchu TW