发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE |
摘要 |
A stopper film, a sacrifice film, and a beam configuration material film are formed by laminating the films in this order on a semiconductor substrate. A cylinder hole that penetrates the stopper film, the sacrifice film, and the beam configuration material film is formed, and a lower electrode that covers the inner surface of the cylinder hole is formed. The beam configuration material film is patterned so as to form a beam that is connected to at least a part of the outer circumferential surface of the lower electrode, thereby exposing a part of the sacrifice film. The sacrifice film is removed by wet etching, and a hollow is formed in the surface of the beam, said hollow being deeper than a hollow formed in the surface of the stopper film. |
申请公布号 |
US2015311210(A1) |
申请公布日期 |
2015.10.29 |
申请号 |
US201314439074 |
申请日期 |
2013.10.23 |
申请人 |
PS5 LUXCO S.A.R.L. |
发明人 |
Sugioka Shigeru |
分类号 |
H01L27/108;H01L21/311;H01L21/02;H01L49/02 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device manufacturing method comprising:
laminating a stopper film, a sacrificial film, and a beam constituent material film in succession on a semiconductor substrate; forming a cylinder hole that penetrates the stopper film, the sacrificial film, and the beam constituent material film; forming a lower electrode that covers an inner surface of the cylinder hole; patterning the beam constituent material film so as to form a beam that is connected to at least a portion of the external circumferential surface of the lower electrode thereby, exposing a portion of the sacrificial film; and removing the sacrificial film with wet etching and forming a hollow in the surface of the beam that is deeper than a hollow formed in the surface of the stopper film. |
地址 |
L-2121Luxembourg LU |