| 发明名称 |
SEMICONDUCTOR DEVICE HAVING A TEST CONTROLLER AND METHOD OF OPERATION |
| 摘要 |
A semiconductor device includes a test port configured to communicate with a test system, a test command controller coupled to communicate with the test port, a peripheral module configured to communicate with the test command controller, a processor, and a test memory configured to communicate with the test command controller and the processor. The test command controller is configured to issue a first set of one or more instructions to test the peripheral module and to issue a second set of one or more instructions to the processor to process information in the test memory resulting from the test of the peripheral module. |
| 申请公布号 |
US2015310932(A1) |
申请公布日期 |
2015.10.29 |
| 申请号 |
US201414264473 |
申请日期 |
2014.04.29 |
| 申请人 |
NAPPI CHRIS P.;McGinty Stephen F. |
发明人 |
NAPPI CHRIS P.;McGinty Stephen F. |
| 分类号 |
G11C29/38 |
主分类号 |
G11C29/38 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor device, comprising:
a test port configured to communicate with a test system; a test command controller coupled to communicate with the test port; a peripheral module configured to communicate with the test command controller; a processor; a test memory configured to communicate with the test command controller and the processor; wherein the test command controller is configured to issue a first set of one or more instructions to test the peripheral module and to issue a second set of one or more instructions to the processor to process information in the test memory resulting from the test of the peripheral module. |
| 地址 |
Austin TX US |
