发明名称 METHOD AND APPARATUS FOR OPTICAL PROXIMITY CORRECTION
摘要 Some embodiments of the present disclosure provide an integrated circuit (IC) design method. The method includes (1) receiving a first layout comprising stripe patterns with a first separation and a first width; (2) receiving a second layout comprising stripe patterns with a second width narrower than the first separation, each stripe on the second layout is configured to situate between two adjacent stripes on the first layout when overlaying the first layout and the second layout; (3) performing a separation check by identifying a spacing between a stripe on the second layout and one of the two adjacent stripes on the first layout; and (4) adjusting the spacing between the stripe on the second layout and one of the two adjacent stripes on the first layout when the separation check determining the spacing is greater than a predetermined value.
申请公布号 US2015310156(A1) 申请公布日期 2015.10.29
申请号 US201414262082 申请日期 2014.04.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. 发明人 SU CHUAN-FANG;HSU CHIH-CHUN;CHEN HSING-WANG;CHEN RUNG-SHIANG;HUANG CHING-JUINN
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. An integrated circuit (IC) design method, comprising: receiving a first layout comprising stripe patterns with a first separation and a first width; receiving a second layout comprising stripe patterns with a second width narrower than the first separation, wherein each stripe of the stripe patterns on the second layout is configured to situate between two adjacent stripes of the stripe patterns on the first layout when overlaying the first layout and the second layout; performing a separation check by identifying a spacing between a stripe on the second layout and one of the two adjacent stripes on the first layout; and adjusting the spacing between the stripe on the second layout and one of the two adjacent stripes on the first layout when the separation check determining the spacing is greater than a predetermined value.
地址 HSINCHU TW