Computer-Aided Simulation Method For Atomic-Resolution Scanning Seebeck Microscope (SSM) Images

摘要

A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position, using the following equation:;V(r)=Vdiff+Scoh(r)∫∇T(r;r′)·r′-rr′-r33r′;in which V(r) denotes the local thermoelectric voltage, Vdiff denotes a thermoelectric voltage drop in a diffusive transport region in a tip and a sample, Scoh(r) denotes a position-dependent Seebeck coefficient, r denotes a distance measured from a point voltage probe, r′ denotes material internal coordinates, ∇T(r;r′) denotes a temperature gradient radially weighted by a factor of 1/r2, and;∫∇T(r;r′)·r′-rr′-r33r′;denotes a volume integral of a temperature profile.

主权项

1. A computer-aided simulation method for a scanning Seebeck microscope (SSM) image, wherein a computer calculates a local thermoelectric voltage for a position of a voltage probe in a material surface, to acquire the SSM image corresponding to the position, using the following equation:V(r)=∫S(r;r′)∇T(r;r′)·r′-rr′-r3d3r′ in which V(r) denotes the local thermoelectric voltage, S(r;r′) denotes a local Seebeck coefficient, ∇T(r;r′) denotes a temperature gradient radially weighted by a factor of 1/r2, r denotes a distance measured from a point voltage probe, and r′ denotes material internal coordinates.