发明名称 Dual-Function Switch and Lead Set for Electrical Instrument Probes
摘要 For decades, a mainstay of electrical and electronic testing has been the conventional use of the multi-meter that used a pair of probes to connect the Device Under Test to the meter. This often proves inadequate for present-day testing because more than one simultaneous or alternate reading or the connection of another testing tool and the reading of its effect on the DUT is often required. The Dual-Function Switch and Lead set (DFSL) of the present invention provides a switch and lead set interfacing two multi-meters, or one multi-meter and one test device or instrument with the DUT, while using the traditional and convenient pair of probes and a simple finger movement on the DFSL. The DFSL facilitates these tests, their safety and integrity, and reduces the time of many test procedures.
申请公布号 US2015309077(A1) 申请公布日期 2015.10.29
申请号 US201514696215 申请日期 2015.04.24
申请人 Chait Paul Nicholas;Chait Stanley 发明人 Chait Paul Nicholas;Chait Stanley
分类号 G01R15/12;G01R15/00 主分类号 G01R15/12
代理机构 代理人
主权项 1. A switch and lead set apparatus for use with a pair of electrical test tools, said apparatus comprising: a switch member adapted for connection to a first electrical test probe, said switch member selectively connectable to a first lead only, a second lead only, and both said first lead and said second lead combined; said first lead adapted for connection to a first polarity socket on a first electrical test tool; said second lead adapted for connection to a first polarity socket on a second electrical test tool; and a third lead adapted to connect a second electrical test probe to a second polarity socket on said first electrical test tool and a second polarity socket on said second electrical test tool.
地址 San Rafael CA US