发明名称 |
Method Of Forming Chip With Through Silicon Via Electrode |
摘要 |
The present invention provides a method of forming a chip with TSV electrode. A substrate with a first surface and a second surface is provided. A thinning process is performed from a side of the second surface so the second surface becomes a third surface. Next, a penetration via which penetrates through the first surface and the third surface is formed in the substrate. A patterned material layer is formed on the substrate, wherein the patterned material layer has an opening exposes the penetration via. A conductive layer is formed on the third surface thereby simultaneously forming a TSV electrode in the penetration via and a surface conductive layer in the opening. |
申请公布号 |
US2015311117(A1) |
申请公布日期 |
2015.10.29 |
申请号 |
US201514791265 |
申请日期 |
2015.07.03 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Lin Ming-Tse;Lin Chu-Fu;Kuo Chien-Li;Lin Yung-Chang |
分类号 |
H01L21/768;H01L23/00;H01L21/302;H01L21/283 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a chip with a though-silicon-via (TSV) electrode, comprising:
providing a substrate, wherein the substrate has a first surface and a second surface; performing a thinning process from the second surface of the substrate thereby making the second surface become a third surface; forming a penetration via which penetrates through the first surface and the third surface; forming a patterned material layer on the third surface of the substrate, wherein the patterned material layer has an opening exposing the penetration via; and simultaneously filling a conductive layer into the penetration via and the opening such that the conductive layer in the penetration via becomes a TSV electrode and the conductive layer in the opening becomes a surface conductive layer. |
地址 |
Hsin-Chu City TW |