发明名称 Method Of Forming Chip With Through Silicon Via Electrode
摘要 The present invention provides a method of forming a chip with TSV electrode. A substrate with a first surface and a second surface is provided. A thinning process is performed from a side of the second surface so the second surface becomes a third surface. Next, a penetration via which penetrates through the first surface and the third surface is formed in the substrate. A patterned material layer is formed on the substrate, wherein the patterned material layer has an opening exposes the penetration via. A conductive layer is formed on the third surface thereby simultaneously forming a TSV electrode in the penetration via and a surface conductive layer in the opening.
申请公布号 US2015311117(A1) 申请公布日期 2015.10.29
申请号 US201514791265 申请日期 2015.07.03
申请人 UNITED MICROELECTRONICS CORP. 发明人 Lin Ming-Tse;Lin Chu-Fu;Kuo Chien-Li;Lin Yung-Chang
分类号 H01L21/768;H01L23/00;H01L21/302;H01L21/283 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of forming a chip with a though-silicon-via (TSV) electrode, comprising: providing a substrate, wherein the substrate has a first surface and a second surface; performing a thinning process from the second surface of the substrate thereby making the second surface become a third surface; forming a penetration via which penetrates through the first surface and the third surface; forming a patterned material layer on the third surface of the substrate, wherein the patterned material layer has an opening exposing the penetration via; and simultaneously filling a conductive layer into the penetration via and the opening such that the conductive layer in the penetration via becomes a TSV electrode and the conductive layer in the opening becomes a surface conductive layer.
地址 Hsin-Chu City TW