| 发明名称 |
SYSTEM AND METHOD FOR IMAGE BASED INSPECTION OF AN OBJECT |
| 摘要 |
A method for image based inspection of an object includes receiving an image of an object from an image capture device, wherein the image includes a representation of the object with mil-level precision. The method further includes projecting a measurement feature of the object from the image onto a three-dimensional (3D) model of the object based on a final projection matrix; determining a difference between the projected measurement feature and an existing measurement feature on the 3D model; and sending a notification including the difference between the projected measurement feature and the existing measurement feature. |
| 申请公布号 |
US2015310604(A1) |
申请公布日期 |
2015.10.29 |
| 申请号 |
US201414260624 |
申请日期 |
2014.04.24 |
| 申请人 |
General Electric Company |
发明人 |
Lim Ser Nam;Garza Jose Abiel;Diwinsky David Scott;Guan Li;Liu Shubao;Yang Xingwei;Rittscher Jens |
| 分类号 |
G06T7/00;G06K9/52;H04N17/00;G06T17/00 |
主分类号 |
G06T7/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method comprising:
receiving an image of an object from an image capture device, wherein the image includes a representation of the object with mil-level precision; projecting a measurement feature of the object from the image onto a three-dimensional (3D) model of the object based on a final projection matrix; determining a difference between the projected measurement feature and an existing measurement feature on the 3D model; and sending a notification including the difference between the projected measurement feature and the existing measurement feature. |
| 地址 |
Schenectady NY US |
