| 摘要 |
The present disclosure relates to a light emitting element inspecting apparatus comprising: a base layer having a plurality of light emitting elements; a light measurement device disposed in at least one of the lower side and the upper side of the base layer to be spaced apart from the base layer and to receive light from a light emitting element to be measured; and a light path changing member which is disposed below and adjacent to the base layer and has an uneven part changing the traveling direction of light from the plurality of light emitting elements. |
