LOG-LIKELIHOOD RATIO AND LUMPED LOG-LIKELIHOOD RATIO GENERATION FOR DATA STORAGE SYSTEMS

摘要

An error management system for a data storage device can generate soft-decision log-likelihood ratios (LLRs) for upper and lower pages of memory cells in MLC solid-state media. Disclosed are systems and methods for generating lumped-LLR for upper pages, wherein at least some voltage threshold reads are linked together in order to reduce the number of reads. Efficiency and reliability are thereby improved.