发明名称 TESTING SYSTEM AND METHOD
摘要 <p>A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.</p>
申请公布号 EP2936137(A1) 申请公布日期 2015.10.28
申请号 EP20130805712 申请日期 2013.12.02
申请人 GENERAL ELECTRIC COMPANY 发明人 GRONINGER, DANIEL, SCOTT;WARD, ROBERT, CARROLL;DE FROMONT, FRANCOIS, XAVIER;SHAFFER, CHAD, MARTIN
分类号 G01N29/00;G01N21/00;G01N23/00;G09B19/24 主分类号 G01N29/00
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