发明名称 レジスト組成物、レジストパターン形成方法及び高分子化合物
摘要 A resist composition including a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, wherein the base component (A) includes a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-1). In the formula (a5-1), R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; each of Ra and Rb independently represents a hydrocarbon group which may have a substituent, and Ra and Rb may be mutually bonded to form a ring.
申请公布号 JP5802394(B2) 申请公布日期 2015.10.28
申请号 JP20110006940 申请日期 2011.01.17
申请人 東京応化工業株式会社 发明人 土屋 純一;高木 大地;新井 雅俊;塩野 大寿;平野 智之
分类号 G03F7/039;C08F220/58 主分类号 G03F7/039
代理机构 代理人
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