发明名称 SYSTEM AND METHOD FOR INSPECTING SURFACE FLUSHNESS
摘要 A system includes one or more memory devices operable to store surface profile data and a processor (402) operable to execute logic. The processor (402) accesses the surface profile data for a first surface (124) of a first component (120) and a second surface (134) of a second component (130), and determines, based at least in part on the surface profile data for the first and second surfaces (124, 134), a best-fit between the first and second surfaces (124, 134). The processor (402) determines a first distance (160) from a first edge-of-part point (128) on the first surface (124) to the best-fit, and a second distance (170) from a second edge-of-part point (138) on the second surface (134) to the best-fit. The processor (402) determines a flushness between the first surface (124) and the second surface (134) based at least in part on the first and second distances (160, 170).
申请公布号 EP2937664(A1) 申请公布日期 2015.10.28
申请号 EP20150164409 申请日期 2015.04.21
申请人 LOCKHEED MARTIN CORPORATION 发明人 DELAUNE, MICHAEL J.;BUCHANAN, WILLIAM B.
分类号 G01B11/14;G01B21/16;G01B21/24 主分类号 G01B11/14
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