发明名称 半導体装置の製造方法
摘要 A semiconductor device manufacturing method includes forming a dielectric film on a semiconductor substrate; performing a heat treatment on the dielectric film; forming an electrode on a first region of the dielectric film; irradiating an ionized gas cluster to a second region of the dielectric film where the electrode is not formed; and removing the second region of the dielectric film where the ionized gas cluster is irradiated by a wet etching after the irradiating of the ionized gas cluster.
申请公布号 JP5801676(B2) 申请公布日期 2015.10.28
申请号 JP20110220257 申请日期 2011.10.04
申请人 東京エレクトロン株式会社 发明人 赤坂 泰志;秋山 浩二;東島 裕和
分类号 H01L21/336;H01L21/316;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/78 主分类号 H01L21/336
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