MEASUREMENT BY MEANS OF ATOM INTERFEROMETRY

摘要

The invention relates to a measurement by means of atom interferometry, using a Raman source that is created by modulating a monochromatic laser source. By conveniently selecting positions in which interactions between atoms and a laser radiation, produced by the Raman source, are caused, it is possible to eliminate or at least reduce a measurement bias caused by supplementary components of the laser radiation. Such a measurement having eliminated or reduced bias can be used in an inertia sensor.