HIGH TEMPERATURE OPTICAL ANALIZING DEVICE AND ANALYZING METHOD USING THE SAME

摘要

The present invention relates to a high temperature optical analyzing device and an optical analyzing method using the same, capable of analyzing the feature and the high temperature movement of a subject. The high temperature optical analyzing device according to an embodiment of the present invention includes: a high temperature chamber which includes first and second flat substrates which define an air gap by being separately arranged in a parallel manner, wherein at least one among the first substrate and the second substrate is transparent and the subject is arranged in the air gap; and an optical analyzing device for analyzing the subject. The first substrate or the second substrate is a temperature controllable heating substrate.