MICROCRYSTAL STRUCTURE ANALYSIS DEVICE, MICROCRYSTAL STRUCTURE ANALYSIS METHOD, AND X-RAY SHIELD DEVICE

摘要

A microcrystal structure analysis apparatus, a microcrystal structure analysis method, and an X-ray shielding device are provided which allow a favorable X-ray diffraction image to be obtained even when X rays are applied to a pseudo-single-crystallized sample while the sample is rotated. A microcrystal structure analysis apparatus 1 of the present invention includes: a magnetic field generation unit 12; a sample drive unit 13 configured to rotate a sample container 2 containing a sample having microcrystals 3 suspended therein relative to the magnetic field generation unit 12 such that a temporally varying magnetic field is applied to the sample container 2 to three-dimensionally orient the microcrystals 3; an X-ray source 21 configured to apply X rays a to the sample container 2 that is being rotated by the sample drive unit 13; an X-ray detection unit 23 capable of detecting the X rays a that have passed through and have been diffracted by the sample container 2; and a state switching device G configured to cause a state where detection of the X rays a by the X-ray detection unit 23 is disenabled or a state where detection of the X rays a by the X-ray detection unit 23 is enabled, in accordance with a rotational position of a specific part 2a which is a part of the sample container 2 in a rotation direction thereof.