发明名称 |
Nonvolatile semiconductor memory device and method of controlling the same |
摘要 |
This nonvolatile semiconductor memory device comprises: a word line connected to a control gate; a bit line electrically connected to one end of a NAND cell unit; a source line electrically connected to the other end of the NAND cell unit; and a control circuit that controls a voltage applied to a semiconductor layer, the control gate, the bit line, and the source line.;The control circuit is configured to, when performing a write verify operation for determining whether a write operation has been completed or not after finishing the write operation, temporarily raise a voltage of the bit line or the source line to a light erase voltage which is higher than a voltage applied to the bit line or the source line during the write verify operation. |
申请公布号 |
US9171637(B2) |
申请公布日期 |
2015.10.27 |
申请号 |
US201414162970 |
申请日期 |
2014.01.24 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Shimura Yasuhiro |
分类号 |
G11C16/06;G11C16/34 |
主分类号 |
G11C16/06 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A nonvolatile semiconductor memory device, comprising:
a memory cell array having NAND cell units arranged therein, each NAND cell unit configured from a memory string and a select transistor connected to both ends of the memory string, the memory string having a plurality of nonvolatile memory cells connected in series therein, the memory cell including a charge storage layer formed on a semiconductor layer via a gate insulating film and a control gate formed on the charge storage layer via an inter-gate insulating film; a word line connected to the control gate; a bit line electrically connected to one end of the NAND cell unit; a source line electrically connected to the other end of the NAND cell unit; and a control circuit that controls a voltage applied to the semiconductor layer, the control gate, the bit line, and the source line, the control circuit being configured to, when performing a write verify operation for determining whether a write operation has been completed or not after finishing the write operation, temporarily raise, prior to execution of the write verify operation, a voltage of the bit line or the source line to a light erase voltage which is higher than a voltage applied to the bit line or the source line during the write verify operation. |
地址 |
Minato-ku JP |