发明名称 |
Photoelectric conversion device, method of manufacturing the same, and camera |
摘要 |
A photoelectric conversion device, comprising a photoelectric conversion portion, provided in a semiconductor substrate, including a first semiconductor region of a first conductivity type, a second semiconductor region of the first conductivity type provided adjacent to the first semiconductor region, a third semiconductor region of the first conductivity type provided at a position away from the second semiconductor region, and a gate electrode provided between the second semiconductor region and the third semiconductor region, wherein the second semiconductor region is provided at a position away from the gate electrode, and the semiconductor substrate includes a region of a second conductivity type within a region extending from an edge of the second semiconductor region to below the gate electrode. |
申请公布号 |
US9171880(B2) |
申请公布日期 |
2015.10.27 |
申请号 |
US201414320818 |
申请日期 |
2014.07.01 |
申请人 |
Canon Kabushiki Kaisha |
发明人 |
Kodaira Shinji;Kuwabara Hideshi;Kinugasa Tomohisa |
分类号 |
H04N9/64;H01L27/146;H04N5/361;H04N5/3745 |
主分类号 |
H04N9/64 |
代理机构 |
Fitzpatrick, Cella, Harper & Scinto |
代理人 |
Fitzpatrick, Cella, Harper & Scinto |
主权项 |
1. A photoelectric conversion device comprising:
a photoelectric conversion portion, provided in a semiconductor substrate, including a first semiconductor region of a first conductivity type; a second semiconductor region of the first conductivity type, provided adjacent to the first semiconductor region, having a lower concentration of an impurity of the first conductivity than the first semiconductor region; a third semiconductor region of the first conductivity type provided at a position away from the second semiconductor region; and a gate electrode provided on an insulation film on the semiconductor substrate between the second semiconductor region and the third semiconductor region, wherein, in a planar view, the second semiconductor region is provided at a position away from the gate electrode, and the semiconductor substrate includes a region of a second conductivity type different in polarity from the first conductivity type within a region extending from an edge of the second semiconductor region to below the gate electrode. |
地址 |
Tokyo JP |