发明名称 |
Projection exposure apparatus with at least one manipulator |
摘要 |
A projection exposure apparatus for microlithography includes a projection lens which includes a plurality of optical elements for imaging mask structures onto a substrate during an exposure process. The projection exposure apparatus also includes at least one manipulator configured to change, as part of a manipulator actuation, the optical effects of at least one of the optical elements within the projection lens by changing a state variable of the optical element along a predetermined travel. The projection exposure apparatus further includes an algorithm generator configured to generate a travel generating optimization algorithm, adapted to at least one predetermined imaging parameter, on the basis of the at least one predetermined imaging parameter. |
申请公布号 |
US9170497(B2) |
申请公布日期 |
2015.10.27 |
申请号 |
US201313790957 |
申请日期 |
2013.03.08 |
申请人 |
Carl Zeiss SMT GmbH |
发明人 |
Bittner Boris;Wabra Norbert;von Hodenberg Martin |
分类号 |
G03B27/54;G03B27/42;G03F7/20 |
主分类号 |
G03B27/54 |
代理机构 |
Fish & Richardson P.C. |
代理人 |
Fish & Richardson P.C. |
主权项 |
1. An apparatus, comprising:
a projection lens comprising a plurality of optical elements configured to image mask structures onto a substrate during an exposure process, the plurality of optical elements comprising a first optical element; a manipulator configured to change, as part of a manipulator actuation, optical effects of the first optical element by changing a state variable of the first optical element along a predetermined travel; a first computing device configured to generate a travel algorithm based on at least one imaging parameter, the at least one imaging parameter comprising structure information with respect to mask structures to be imaged during a subsequent exposure process and/or structure information with respect to an angular distribution of exposure radiation radiated onto the mask structures during the subsequent exposure process; and a second computing device configured to establish a travel for a manipulator actuation based on the travel algorithm, wherein the apparatus is a microlithography projection exposure apparatus. |
地址 |
Oberkochen DE |