发明名称 Projection exposure apparatus with at least one manipulator
摘要 A projection exposure apparatus for microlithography includes a projection lens which includes a plurality of optical elements for imaging mask structures onto a substrate during an exposure process. The projection exposure apparatus also includes at least one manipulator configured to change, as part of a manipulator actuation, the optical effects of at least one of the optical elements within the projection lens by changing a state variable of the optical element along a predetermined travel. The projection exposure apparatus further includes an algorithm generator configured to generate a travel generating optimization algorithm, adapted to at least one predetermined imaging parameter, on the basis of the at least one predetermined imaging parameter.
申请公布号 US9170497(B2) 申请公布日期 2015.10.27
申请号 US201313790957 申请日期 2013.03.08
申请人 Carl Zeiss SMT GmbH 发明人 Bittner Boris;Wabra Norbert;von Hodenberg Martin
分类号 G03B27/54;G03B27/42;G03F7/20 主分类号 G03B27/54
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. An apparatus, comprising: a projection lens comprising a plurality of optical elements configured to image mask structures onto a substrate during an exposure process, the plurality of optical elements comprising a first optical element; a manipulator configured to change, as part of a manipulator actuation, optical effects of the first optical element by changing a state variable of the first optical element along a predetermined travel; a first computing device configured to generate a travel algorithm based on at least one imaging parameter, the at least one imaging parameter comprising structure information with respect to mask structures to be imaged during a subsequent exposure process and/or structure information with respect to an angular distribution of exposure radiation radiated onto the mask structures during the subsequent exposure process; and a second computing device configured to establish a travel for a manipulator actuation based on the travel algorithm, wherein the apparatus is a microlithography projection exposure apparatus.
地址 Oberkochen DE