发明名称 CONFIGURATION MEMORY
摘要 PROBLEM TO BE SOLVED: To propose a nonvolatile configuration memory having a small area.SOLUTION: The configuration memory related to the present embodiment includes: memory cell MC0 comprising a first MISFET Mwhose source and drain on one side are connected to a first bit line LBLand whose gate is connected to a first word line WL_C1 and a second MISFET Mwhose source and drain on one side are connected to a second bit line LBLand whose gate is connected to the first word line WL_C1; and a sense amplifier SA0 connected to the first and second bit lines LBLand LBL. Data are written into the memory cell MC0 by injecting channel hot electrons into a gate insulation layer of the first MISFET Mthereby changing a threshold voltage of the first MISFET Mfrom a first value to a second value and leaving a threshold voltage of the second MISFET Mas the first value.
申请公布号 JP2015185180(A) 申请公布日期 2015.10.22
申请号 JP20140058812 申请日期 2014.03.20
申请人 TOSHIBA CORP 发明人 TATSUMURA KOSUKE
分类号 G11C16/02;G11C16/04;G11C16/06;H01L21/336;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792;H03K19/177 主分类号 G11C16/02
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