发明名称 SIMS ANALYSIS METHOD AND SIMS ANALYSIS DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a SIMS analysis method capable of preventing contamination of a solid sample as a measuring object, stably fixing the solid sample, and exhibiting sufficient contrast, and provide a SIMS analysis device for analyzing a solid sample by the SIMS analysis method.SOLUTION: In the method of analyzing a solid sample by SIMS, as a fixing member for fixing the solid sample, a fixing member including, on its surface, a fibrous columnar structure having a plurality of fibrous columns of a length of 200μm or more is used. The SIMS analysis device analyzes a solid sample by SIMS, and includes a fixing member for fixing the solid sample. The fixing member includes, on its surface, a fibrous columnar structure having a plurality of fibrous columns of a length of 200μm or more.</p>
申请公布号 JP2015184084(A) 申请公布日期 2015.10.22
申请号 JP20140059490 申请日期 2014.03.24
申请人 NITTO DENKO CORP 发明人 MAENO YOHEI
分类号 G01N27/62;C01B31/02;H01J49/04 主分类号 G01N27/62
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