发明名称 |
Through-Polymer Via (TPV) and Method to Manufacture Such a Via |
摘要 |
Vias for three dimensional (3D) stacking, packaging and heterogeneous integration of semi-conductor layers and wafers and a process for the manufacture of a via, to a via, to a 3D circuit and to a semiconductor device. Vias are interconnects used to vertically interconnect chips, devices, interconnection layers and wafers, i.e., in an out-of-plane direction. |
申请公布号 |
US2015303131(A1) |
申请公布日期 |
2015.10.22 |
申请号 |
US201514788275 |
申请日期 |
2015.06.30 |
申请人 |
Technische Universiteit Delft |
发明人 |
Poelma Regnerus Hermannus;van Zeijl Henk;Zhang Guoqi |
分类号 |
H01L23/48;H01L21/768 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
1. A process for the manufacture of a via for three dimensional stacking, packaging and/or heterogeneous integration of semiconductor devices and/or wafers comprising:
(a) providing a microstructure of polymer on a carrier layer or substrate; (b) coating the microstructure with a layer of a first electrically conducting material to provide a coated microstructure; and (c) encapsulating the coated microstructure within a second electrically insulating material such that the coated microstructure forms an interconnect between upper and lower surfaces of the second electrically insulating material. |
地址 |
Delft NL |