发明名称 Self Aligned Patterning With Multiple Resist Layers
摘要 A method for using self aligned multiple patterning with multiple resist layers includes forming a first patterned resist layer onto a substrate, forming a spacer layer on top of the first patterned resist layer such that spacer forms on side walls of features of the first resist layer, and forming a second patterned resist layer over the spacer layer and depositing a masking layer. The method further includes performing a planarizing process to expose the first patterned resist layer, removing the first resist layer, removing the second resist layer, and exposing the substrate.
申请公布号 US2015301447(A1) 申请公布日期 2015.10.22
申请号 US201514753523 申请日期 2015.06.29
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Shieh Ming-Feng;Lai Chih-Ming;Hsieh Ken-Hsien;Liu Ru-Gun;Chang Shih-Ming
分类号 G03F7/00;G03F7/20 主分类号 G03F7/00
代理机构 代理人
主权项 1. A method comprising: forming a first patterned resist layer over a substrate; forming a spacer layer over the first patterned resist layer such that the spacer layer covers the first patterned resist layer; forming a second patterned resist layer over the spacer layer; forming a hard mask layer over the second patterned resist layer; and removing a first portion of the second patterned resist layer and a portion of the spacer layer to expose the first patterned resist layer, wherein a second portion of the second patterned resist layer is disposed over the substrate after removing the first portion of the second patterned resist layer.
地址 Hsin-Chu TW