发明名称 SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL PRE-CHARACTERIZATION OF A SAMPLE FOR FAST AND NON-DESTRUCTIVE ON SAMPLE NAVIGATION DURING NANOPROBING
摘要 A system for performing sample probing. The system including an topography microscope configured to receive three-dimensional coordinates for a sample based on at least three fiducial marks; receive the sample mounted in a holder; and navigate to at least a location on the sample based on the at least three fiducial marks and the three-dimensional coordinates.
申请公布号 US2015301078(A1) 申请公布日期 2015.10.22
申请号 US201414552399 申请日期 2014.11.24
申请人 DCG Systems, Inc. 发明人 Ukraintsev Vladimir A.;Stallcup Richard;Pryadkin Sergiy;Berkmyre Mike;Sanders John
分类号 G01Q10/02;G01Q30/02 主分类号 G01Q10/02
代理机构 代理人
主权项 1. A system for performing sample probing, comprising: an topography microscope configured to: receive three-dimensional coordinates for a sample based on at least three fiducial marks;receive said sample mounted in a holder; andnavigate to at least a location on said sample based on said at least three fiducial marks and said three-dimensional coordinates.
地址 Fremont CA US