发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device and a manufacturing method of the same, which can improve humidity resistance and corrosion resistance and improve heat dissipation performance and reliability without an increase in manufacturing cost.SOLUTION: A semiconductor device comprises: a wiring board 1 having a first electrode 2 and a second electrode 3 provided around the first electrode 2; and a semiconductor chip 5 having a semiconductor substrate 6, a semiconductor circuit pattern 8 having a pad 7 including a solder provided on a principal surface of the semiconductor substrate 6 and a guard ring 9 including a solder provided on the principal surface of the semiconductor substrate 6 around the semiconductor circuit pattern 8. The semiconductor chip 5 is flip chip mounted on the wiring board 1. The pad 7 is bonded to the first electrode 2. The guard ring 9 is bonded to the second electrode 3. A melting point of the solder of the pad 7 is lower than a melting point of the solder of the guard ring 9.</p>
申请公布号 JP2015185818(A) 申请公布日期 2015.10.22
申请号 JP20140063932 申请日期 2014.03.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 HASUIKE ATSUSHI
分类号 H01L23/02;H01L21/60 主分类号 H01L23/02
代理机构 代理人
主权项
地址