| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide the controller of a component mounter which can investigate the cause of an abnormality by determining reproduction of the abnormality reliably and quickly, while maintaining the reproducible operational state of the abnormality, even if a rare abnormality occurs.SOLUTION: A controller 1 for controlling a control object provided in a component mounter for mounting an electronic component on a substrate includes a control execution device (a CPU2 and a host memory 3) for calculating a command value and commanding the control object, and sending a portion of the internal data, used for calculation, as the analysis data, and an independent analyzer (a field programmable gate array 6) performing the analysis process for analyzing the operational abnormality of the control execution device, based on the analysis data thus received without affecting operation of the control execution device.</p> |
