发明名称 INSPECTION SYSTEM AND INSPECTION METHOD OF PANTAGRAPH SLIDER
摘要 <p>PROBLEM TO BE SOLVED: To provide a technique for inspecting a state of a pantagraph slider properly.SOLUTION: An inspection system of a pantagraph slider comprises: a wiring 3 which is disposed obliquely by an angle other than orthogonal angle with respect to a slider unit 100 moving according to travel of a railway vehicle in plan view; shape detection means for detecting a shape of the slider unit 100 from an upper part side of the slider unit 100; and state determination means for determining a state of the slider unit 100 on the basis of the shape of the slider unit 100 detected by the shape detection means. The shape detection means detects the shape of the slider unit 100 by dividing the slider unit into a first detection area corresponding to one side sandwiching a center part in a longitudinal direction of the slider unit 100 and a second detection area corresponding to the other side sandwiching the center part, and the first detection area and the second detection area are disposed so as to face each other sandwiching the wiring 3 in the plan view.</p>
申请公布号 JP2015184263(A) 申请公布日期 2015.10.22
申请号 JP20140063804 申请日期 2014.03.26
申请人 OPTEX FA CO LTD 发明人 AOI AKIHIRO;KAWASAKI YOICHI;NAMIKAWA HIROKAZU
分类号 G01B11/02;B60L5/18;B60M1/28;G01B11/245 主分类号 G01B11/02
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