发明名称 |
TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a temperature measurement device and a temperature measurement method capable of accurately measuring the temperature of a measurement object having permeability with respect to radiation energy in a specific wavelength band by using a radiation thermometer.SOLUTION: A control part 10 includes: a relational expression calculation part 11 for calculating a relational expression indicating a relation between an error between the temperature of a silicon wafer measured by a radiation thermometer 3 and the actual temperature of the silicon wafer and the temperature of a reflector; a relational expression storage part 12 for storing the relational expression; and a temperature correction part 13 for correcting the temperature of the silicon wafer measured by the radiation thermometer 3 by using the relational expression.</p> |
申请公布号 |
JP2015184234(A) |
申请公布日期 |
2015.10.22 |
申请号 |
JP20140063157 |
申请日期 |
2014.03.26 |
申请人 |
SCREEN HOLDINGS CO LTD |
发明人 |
HORIKOSHI AKIRA;TABUCHI MASANAO;YASUZAWA HITOSHI |
分类号 |
G01J5/10;G01J5/00 |
主分类号 |
G01J5/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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