发明名称 TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a temperature measurement device and a temperature measurement method capable of accurately measuring the temperature of a measurement object having permeability with respect to radiation energy in a specific wavelength band by using a radiation thermometer.SOLUTION: A control part 10 includes: a relational expression calculation part 11 for calculating a relational expression indicating a relation between an error between the temperature of a silicon wafer measured by a radiation thermometer 3 and the actual temperature of the silicon wafer and the temperature of a reflector; a relational expression storage part 12 for storing the relational expression; and a temperature correction part 13 for correcting the temperature of the silicon wafer measured by the radiation thermometer 3 by using the relational expression.</p>
申请公布号 JP2015184234(A) 申请公布日期 2015.10.22
申请号 JP20140063157 申请日期 2014.03.26
申请人 SCREEN HOLDINGS CO LTD 发明人 HORIKOSHI AKIRA;TABUCHI MASANAO;YASUZAWA HITOSHI
分类号 G01J5/10;G01J5/00 主分类号 G01J5/10
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