发明名称 X-RAY ENERGY SPECTRUM MEASUREMENT METHOD, X-RAY ENERGY SPECTRUM MEASUREMENT APPARATUS, AND X-RAY CT APPARATUS
摘要 Provided is an X-ray energy spectrum estimation method capable of reproducing, with high precision, information on an attenuation path to which an X-ray is irradiated, and performing, with high precision, reconstruction of an X-ray CT image by enabling high-precision estimation of spectrum of energy released from an X-ray source device 10. An energy spectrum estimation device 92 normalizes a response function, and calculates a modified efficiency matrix from the normalized response function, a detection efficiency matrix, and a measurement-system correction coefficient. The energy spectrum estimation device 92 then calculates a particular result in accordance with a Bayesian estimation equation, without divergence, with use of the calculated modified efficiency matrix, the normalized modified efficiency matrix, and an attenuation characteristic curve obtained by a measurement circuit 30. The energy spectrum estimation device 92 calculates an X-ray energy spectrum by dividing, by the normalized modified efficiency matrix, the particular result obtained by the Bayesian estimation equation.
申请公布号 EP2932902(A1) 申请公布日期 2015.10.21
申请号 EP20150163689 申请日期 2015.04.15
申请人 HITACHI, LTD. 发明人 TAKAGI, HIROYUKI;MURATA, ISAO
分类号 A61B6/03;A61B6/00;G06F17/18 主分类号 A61B6/03
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