发明名称 半導体記憶装置
摘要 <p>In a static random access memory (SRAM) device having a hierarchical bit line architecture, a local sense amplifier (SA) circuit includes P-channel transistors which precharge local bit lines connected to memory cells, P-channel transistors each having a gate connected to a corresponding one of the local bit lines and a drain connected to a corresponding one of global bit lines, and N-channel transistors each having a gate connected to a corresponding one of the global bit lines and a drain connected to a corresponding one of the local bit lines. As a result, restore operation to a non-selected memory cell during write operation can be achieved without the need of a fine timing control, the speed of read operation by a feedback function can be increased, and the area can be reduced.</p>
申请公布号 JP5798120(B2) 申请公布日期 2015.10.21
申请号 JP20120530449 申请日期 2011.10.26
申请人 发明人
分类号 G11C11/419;G11C11/417 主分类号 G11C11/419
代理机构 代理人
主权项
地址