发明名称 VIRTUAL CLUSTER METER (VCM)
摘要 A distributed metering platform virtualizes functions of a conventional metrology sensor and separates the virtualized functions from a metrology sensor. One or more virtual meters or applications may be instantiated at a network communication device that is remote from the metrology sensor and processes metrology data received from the metrology sensor. Each virtual meter may include multiple partitioned application spaces that are isolated from one another. In one example, a first application space includes a locked version of code and a second application space includes an unlocked version of code. Furthermore, each virtual meter may be isolated from other virtual meters such that each virtual meter is unable to affect operations and/or data associated with other virtual meters.
申请公布号 EP2932202(A1) 申请公布日期 2015.10.21
申请号 EP20130803314 申请日期 2013.11.04
申请人 ITRON, INC. 发明人 PONTIN, JOSEPH;LAKICH, DANIEL, M.;BUFFINGTON, JOHN
分类号 G01D4/00 主分类号 G01D4/00
代理机构 代理人
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