发明名称 |
Immersion liquid, exposure apparatus, and exposure process |
摘要 |
An immersion liquid is provided comprising an ion-forming component, e.g. an acid or a base, which has a relatively high vapor pressure. Also provided are lithography processes and lithography systems using the immersion liquid. |
申请公布号 |
US9164391(B2) |
申请公布日期 |
2015.10.20 |
申请号 |
US201414504130 |
申请日期 |
2014.10.01 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
Jansen Hans;Stavenga Marco Koert;Verspay Jacobus Johannus Leonardus Hendricus;Janssen Franciscus Johannes Joseph;Kuijper Anthonie |
分类号 |
H01L21/67;G03F7/20 |
主分类号 |
H01L21/67 |
代理机构 |
Pillsbury Winthrop Shaw Pittman LLP |
代理人 |
Pillsbury Winthrop Shaw Pittman LLP |
主权项 |
1. A device manufacturing process comprising:
adding a component, comprising carbon dioxide, to an aqueous liquid; and exposing a photosensitive substrate to radiation, wherein the radiation has passed through the aqueous liquid comprising the component prior to reaching the photosensitive substrate. |
地址 |
Veldhoven NL |