发明名称 Pulsed gas plasma doping method and apparatus
摘要 A method and apparatus for doping a surface of a substrate with a dopant, with the dopant being for example phosphine or arsine. The doping is performed with a plasma formed primarily of an inert gas such as helium or argon, with a low concentration of the dopant. To provide conformal doping, preferably to form a monolayer of the dopant, the gas flow introduction location is switched during the doping process, with the gas mixture primarily introduced through a center top port in the process chamber during a first period of time followed by introduction of the gas mixture primarily through peripheral or edge injection ports for a second period of time, with the switching continuing in an alternating fashion as the plasma process.
申请公布号 US9165771(B2) 申请公布日期 2015.10.20
申请号 US201414244481 申请日期 2014.04.03
申请人 TOKYO ELECTRON LIMITED 发明人 Ventzek Peter;Nemoto Takenao;Ueda Hirokazu;Kobayashi Yuuki;Horigome Masahiro
分类号 H01L21/223;H01J37/32;H01L21/265;H01L21/66;H01L29/66 主分类号 H01L21/223
代理机构 Rothwell, Figg, Ernst & Manbeck, P.C. 代理人 Rothwell, Figg, Ernst & Manbeck, P.C.
主权项 1. A method for plasma processing comprising: loading a substrate into a plasma processing chamber and placing the substrate on a substrate holder, the plasma processing chamber having a top wall opposing the substrate holder, and a peripheral wall surrounding the substrate holder; forming a plasma in the plasma processing chamber; introducing a first gas mixture, for a first time period, at a first flow rate, into the plasma processing chamber, from at least one gas injection port located in a top central region of the plasma processing chamber, the first gas mixture comprising a dopant species; following the introduction of the first gas mixture, introducing a second gas mixture, for a second time period, at a second flow rate, into the plasma processing chamber, from at least one gas injection port located in a peripheral region of the plasma processing chamber, the second gas mixture comprising the dopant species, wherein during at least a portion of the second time period the second flow rate is at least 80% of a total flow rate from both the at least one gas injection port located in the top central region and the at least one injection port located in the peripheral region; repeating the steps of introducing the first gas mixture and introducing the second gas mixture, to form a layer of dopant species on structures on the substrate.
地址 Tokyo JP