| 发明名称 | Ionization probe assemblies | ||
| 摘要 | The invention relates generally to sample ionization, and provides ionization probe assemblies, systems, computer program products, and methods useful for this purpose. | ||
| 申请公布号 | US9165740(B2) | 申请公布日期 | 2015.10.20 |
| 申请号 | US201414450884 | 申请日期 | 2014.08.04 |
| 申请人 | IBIS BIOSCIENCES, INC. | 发明人 | Hofstadler Steven A.;Gutierrez Jose R.;Hannis James C.;Drader Jared J.;Bare Rex O.;Smith Jeffrey C.;Gleason Paul J.;Nathanson Jared |
| 分类号 | H01J49/10;H01J49/04;H01J49/26;F23D11/32;H01J27/02;G01R31/28;H01J49/16;C12Q1/68;G01N23/00 | 主分类号 | H01J49/10 |
| 代理机构 | Casimir Jones, S.C. | 代理人 | Casimir David A.;Casimir Jones, S.C. |
| 主权项 | 1. An ionization probe assembly, comprising: at least one ion source housing back plate that comprises one or more surfaces that define at least one spray orifice, which ion source housing back plate is configured to operably connect to an ion source housing; at least one probe support structure coupled to the ion source housing back plate via at least one linear slide; at least one probe substantially fixedly mounted on the probe support structure; and, at least one probe conveyance mechanism operably connected to the probe support structure, which probe conveyance mechanism is configured to convey the probe between at least a first position and a second position, wherein the first position is substantially electrically isolated from the second position. | ||
| 地址 | Carlsbad CA US | ||