发明名称 Magnetic devices having perpendicular magnetic tunnel junction
摘要 Provided are magnetic memory devices with a perpendicular magnetic tunnel junction. The device includes a magnetic tunnel junction including a free layer structure, a pinned layer structure, and a tunnel barrier therebetween. The pinned layer structure may include a first magnetic layer having an intrinsic perpendicular magnetization property, a second magnetic layer having an intrinsic in-plane magnetization property, and an exchange coupling layer interposed between the first and second magnetic layers. The exchange coupling layer may have a thickness maximizing an antiferromagnetic exchange coupling between the first and second magnetic layers, and the second magnetic layer may exhibit a perpendicular magnetization direction, due at least in part to the antiferromagnetic exchange coupling with the first magnetic layer.
申请公布号 US9166144(B2) 申请公布日期 2015.10.20
申请号 US201414535315 申请日期 2014.11.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Oh SeChung;Kim Ki Woong;Kim Younghyun;Kim Whankyun;Park Sang Hwan
分类号 H01L29/82;H01L43/02;H01F10/32;H01L43/08;H01L43/10;B82Y25/00;H01F10/12;H01L27/22 主分类号 H01L29/82
代理机构 Renaissance IP Law Group LLP 代理人 Renaissance IP Law Group LLP
主权项 1. A magnetic tunnel junction device comprising: a free layer structure; a pinned layer structure; and a tunnel barrier between the free layer structure and the pinned layer structure, wherein the pinned layer structure comprises: a first magnetic layer having an intrinsic perpendicular magnetization property;a second magnetic layer having an intrinsic in-plane magnetization property and extrinsic perpendicular magnetization direction; andan exchange coupling layer interposed between the first and second magnetic layers, wherein the exchange coupling layer has a thickness of about 2.5 Å to about 5.0 Å.
地址 KR