发明名称 |
Magnetic devices having perpendicular magnetic tunnel junction |
摘要 |
Provided are magnetic memory devices with a perpendicular magnetic tunnel junction. The device includes a magnetic tunnel junction including a free layer structure, a pinned layer structure, and a tunnel barrier therebetween. The pinned layer structure may include a first magnetic layer having an intrinsic perpendicular magnetization property, a second magnetic layer having an intrinsic in-plane magnetization property, and an exchange coupling layer interposed between the first and second magnetic layers. The exchange coupling layer may have a thickness maximizing an antiferromagnetic exchange coupling between the first and second magnetic layers, and the second magnetic layer may exhibit a perpendicular magnetization direction, due at least in part to the antiferromagnetic exchange coupling with the first magnetic layer. |
申请公布号 |
US9166144(B2) |
申请公布日期 |
2015.10.20 |
申请号 |
US201414535315 |
申请日期 |
2014.11.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Oh SeChung;Kim Ki Woong;Kim Younghyun;Kim Whankyun;Park Sang Hwan |
分类号 |
H01L29/82;H01L43/02;H01F10/32;H01L43/08;H01L43/10;B82Y25/00;H01F10/12;H01L27/22 |
主分类号 |
H01L29/82 |
代理机构 |
Renaissance IP Law Group LLP |
代理人 |
Renaissance IP Law Group LLP |
主权项 |
1. A magnetic tunnel junction device comprising:
a free layer structure; a pinned layer structure; and a tunnel barrier between the free layer structure and the pinned layer structure, wherein the pinned layer structure comprises:
a first magnetic layer having an intrinsic perpendicular magnetization property;a second magnetic layer having an intrinsic in-plane magnetization property and extrinsic perpendicular magnetization direction; andan exchange coupling layer interposed between the first and second magnetic layers, wherein the exchange coupling layer has a thickness of about 2.5 Å to about 5.0 Å. |
地址 |
KR |