发明名称 Method for fabricating a semiconductor device with formation of conductive lines
摘要 A substrate having a first region and second regions disposed on two sides of the first region; a first group of conductive lines extending from the first region to the second regions on the substrate; a second group of conductive lines alternating with the first group of times and extending from the first region to the second regions on the substrate; interlayer insulating layers formed over the substrate; insulating layers formed in first open regions of the interlayer insulating layers and the first group of conductive lines in the second region; and contact plugs contacting second group of conductive line formed in second open regions of the interlayer insulating layer in the second region.
申请公布号 US9165884(B2) 申请公布日期 2015.10.20
申请号 US201314020400 申请日期 2013.09.06
申请人 SK Hynix Inc. 发明人 Kim Mi-Hye;Nam Byung-Sub
分类号 H01L21/768;H01L23/528;H01L21/3213 主分类号 H01L21/768
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A semiconductor device comprising: a substrate having a first region and second regions disposed on two sides of the first region; a first group of conductive lines extending from the first region to the second regions on the substrate; a second group of conductive lines alternating with the first group of times lines and extending from the first region to the second regions on the substrate; interlayer insulating layers formed over the substrate; insulating layers formed in first open regions of the interlayer insulating layers and the first group of conductive lines in the second region; and contact plugs contacting the second group of conductive line formed in second open regions of the interlayer insulating layer in the second region.
地址 Gyeonggi-do KR