发明名称 Spectrometric measurement device and program
摘要 A spectrometric measurement device capable of determining an optimal wavelength for detecting an objective component is provided. One mode of the present invention is a fluorescence measurement device for casting an excitation light of a predetermined wavelength into or onto a sample and detecting a predetermined wavelength of light contained in the fluorescence generated from the sample irradiated with the excitation light.
申请公布号 US9164028(B2) 申请公布日期 2015.10.20
申请号 US201213445210 申请日期 2012.04.12
申请人 SHIMADZU CORPORATION 发明人 Oda Ryutaro
分类号 G01J3/42;G01N21/31;G01N21/64;G01J3/06;G01J3/18;G01J3/44;G01J3/02;G01N21/27;G01J3/28 主分类号 G01J3/42
代理机构 Westerman, Hattori, Daniels & Adrian, LLP 代理人 Westerman, Hattori, Daniels & Adrian, LLP
主权项 1. A spectrometric measurement device for casting an irradiation light into or onto a sample and measuring light obtained from the sample due to an interaction between the irradiation light and the sample, comprising: a) a data memory for storing first measurement data obtained by using, as the aforementioned sample, a solvent containing no objective component and second measurement data obtained by using, as the aforementioned sample, the solvent containing an objective component, each of the first and second measurement data being obtained by varying, over a redetermined wavelength range, a wavelength of the irradiation light or a wavelength of light to be measured or by dispersing the light obtained from the sample and simultaneously detecting the dispersed light at a plurality of wavelengths within a predetermined range; and b) a sensitivity index estimator for calculating a value indicative of a degree of interaction between the objective component and the irradiation light at each wavelength based on the first measurement data and the second measurement data, for calculating an estimate of an amount of noise due to the solvent at each wavelength from the first measurement data, and for calculating an estimate of a sensitivity index at each wavelength from a ratio between the value indicative of the degree of interaction between the objective component and the irradiation light and the estimate of the amount of noise, wherein: the aforementioned interaction is an absorption by the sample, and the spectrometric measurement device is an absorbance determination device including an irradiation optical system for casting light into or onto a sample and a transmission-light detector for detecting the light that has passed through the sample; the data memory is used for storing first measurement data obtained by using, as the aforementioned sample, a solvent containing no objective component and second measurement data obtained by using, as the aforementioned sample, the solvent containing an objective component, each of the first and second measurement data being obtained by varying, over a predetermined wavelength range, a wavelength of the light cast into or onto the sample or a wavelength of the light to be detected, or by dispersing the transmission light from the sample and simultaneously detecting the dispersed transmission light at a plurality of wavelengths within a predetermined range; the sensitivity index estimator is designed to calculate an absorbance of the objective component at each wavelength based on the first measurement data and the second measurement data, to calculate an estimate of the amount of noise due to the solvent at each wavelength from the first measurement data, and to calculate an estimate of the sensitivity index at each wavelength from a ratio between the absorbance value of the objective component and the estimate of the amount of noise, and the sensitivity index estimator calculates an output current Is of the transmission-light detector at each wavelength from the first measurement data and calculates an estimate ΔA of the amount of noise due to the solvent by a following equation: ΔA=√{square root over (1/Is)}  (3)
地址 Kyoto-shi JP