Computing device for enabling concurrent testing

摘要

A method for enabling concurrent testing is described. The method includes generating a plurality of test objects on a computing device. The plurality of test objects is generated using derived classes that are based on a base test class and each of the plurality of test objects corresponds to a separate block in a Device Under Test (DUT). The method also includes adding the plurality of test objects to a queue and sending information based on the plurality of test objects to an Automated Test Equipment (ATE). The method also includes causing the ATE to concurrently test the separate blocks in the DUT using the plurality of test objects.

主权项

1. A method for enabling concurrent testing, comprising:
generating a plurality of test objects on a computing device, wherein:
the plurality of test objects is generated using derived classes that are based on a base test class;the plurality of test objects are sequenced to enable a dynamic selection, during at least a program run-time, of one or more tests; andeach of the plurality of test objects corresponds to a separate block in a Device Under Test (DUT); adding, on the computing device, the plurality of test objects to a queue; sending information based on the plurality of test objects to an Automated Test Equipment (ATE); and causing the ATE to concurrently test the separate blocks in the DUT in parallel using the plurality of test objects in the queue.