发明名称 Rule checking for confining waveform induced constraint variation in static timing analysis
摘要 A method for design rule checking (DRC) during a static timing analysis (STA) of an integrated circuit (IC) design comprises analyzing cells with distorted waveforms in a cell library and generating both library-based waveforms and simulated waveforms for said each cell type according to a plurality of parameters for the cell type. The method further comprises constructing a lookup table based on analysis of the distorted waveforms, wherein the lookup table maps a waveform error to a hold time constraint error of each cell type in the library. The method further comprises identifying one or more cells in the IC design as risky for a timing constraint violation during the STA of the IC design according to the lookup table and re-optimizing the identified risky cell(s) is to reduce risk for the timing constraint violation of the IC design.
申请公布号 US9165105(B2) 申请公布日期 2015.10.20
申请号 US201414273724 申请日期 2014.05.09
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Hsu Meng-Kai;Chen Wen-Hao
分类号 G06F17/50 主分类号 G06F17/50
代理机构 Duane Morris LLP 代理人 Duane Morris LLP
主权项 1. A computer-implemented method for design rule checking (DRC) during a static timing analysis (STA) of an integrated circuit (IC) design, comprising: analyzing cells with distorted waveforms in a cell library and generating both library-based waveforms and simulated waveforms for each cell type according to a plurality of parameters for said each cell type; constructing a lookup table based on analysis of the distorted waveforms, wherein the lookup table maps a waveform error to a hold time constraint error of each cell type in the cell library and is saved in a memory; identifying one or more cells in the IC design as risky for timing constraint violation(s) during the STA of the IC design according to the lookup table and; re-optimizing the identified risky cell(s) to reduce risk for the timing constraint violation(s) of the IC design.
地址 Hsin-Chu TW