发明名称 Infrared-cut filter with sapphire substrate and lens module including the infrared-cut filter
摘要 An IR-cut filter includes a substrate and an infrared filtering film. The substrate is made of sapphire, and includes a first surface and a second surface opposite to the first surface. The infrared filtering film covers the first surface of the substrate and increases the reflectivity in relation to infrared light, thus filtering out the infrared light. The infrared filtering film includes a number of first high refraction index layers and a number of first low refraction index layers alternately stacked on the first surface of the substrate.
申请公布号 US9164262(B2) 申请公布日期 2015.10.20
申请号 US201213720916 申请日期 2012.12.19
申请人 HON HAI PRECSION INDUSTRY CO., LTD. 发明人 Chen Ga-Lane;Wang Chung-Pei;Wei Chao-Tsang
分类号 G02B5/08;G02B5/28;G02B13/14;G02B1/11;G02B5/20 主分类号 G02B5/08
代理机构 Novak Druce Connolly Bove + Quigg LLP 代理人 Novak Druce Connolly Bove + Quigg LLP
主权项 1. An IR-cut filter, comprising: a substrate made of sapphire, a refraction index of the sapphire is from about 1.747 to about 1.760, a growth direction of the sapphire is a-axis (11 20), c-axis (0001), and m-axis (10 10), and the substrate comprising a first surface and a second surface opposite to the first surface; and an infrared filtering film covering on the first surface of the substrate and configured for filtering the infrared lights, the infrared filtering film comprising a number of first high refraction index layers and a number of first low refraction index layers alternately stacked on the first surface of the substrate; wherein the infrared filtering film is represented by (xHyL)η, where η is a positive integer and in a range that 30≦η≦80, x meets the formula that 1<x<2, y meets the formula that 1<y<2, H represents the first high refraction index layers of ¼ central wavelength thickness, L represents the first low refraction index layers of ¼ central wavelength thickness, xH represents the first high refraction index layers of x/4 central wavelength thickness, yL represents the first low refraction index layers of y/4 central wavelength thickness, and η represents a periodicity of stacking the first low refraction index layers and the first high refraction index layers, and wherein the central wavelength is a middle value of a wavelength range of transmission lights or filtered lights.
地址 New Taipei TW