| 发明名称 | System and method for testing a radio frequency integrated circuit | ||
| 摘要 | In an embodiment, a method of testing a radio frequency integrated circuit (RFIC) includes generating high frequency test signals using the on-chip test circuit, measuring signal levels using on-chip power detectors, and controlling and monitoring the on-chip test circuit using low frequency signals. The RFIC circuit is configured to operate at high frequencies, and an on-chip test circuit that includes frequency generation circuitry configured to operate during test modes. | ||
| 申请公布号 | US9166706(B2) | 申请公布日期 | 2015.10.20 |
| 申请号 | US201414198059 | 申请日期 | 2014.03.05 |
| 申请人 | Infineon Technologies AG | 发明人 | Forstner Hans Peter |
| 分类号 | H04W24/00;H04B17/00;G01R31/28;G01R31/3187 | 主分类号 | H04W24/00 |
| 代理机构 | Slater & Matsil, L.L.P. | 代理人 | Slater & Matsil, L.L.P. |
| 主权项 | 1. A method of testing a radio frequency integrated circuit (RFIC) circuit comprising an RF circuit configured to operate at high frequencies, and an on-chip test circuit comprising frequency generation circuitry configured to operate during test modes, the method comprising: generating high frequency test signals using the on-chip test circuit; measuring signal levels using on-chip power detectors; and controlling and monitoring the on-chip test circuit using low frequency signals. | ||
| 地址 | Neubiberg DE | ||