| 摘要 |
The present invention relates to a semiconductor test device and a method for testing a semiconductor. The semiconductor test device includes: semiconductor chips on a wafer; a test signal delivering part which delivers a test signal among the semiconductor chips; a test output part which is provided to each semiconductor chip, and outputs a test output value corresponding to the test signal; and a test output comparison part which performs a parallel test of the semiconductor chips, by comparing the test output value outputted from the test output part of an adjacent semiconductor chip. |
