发明名称 |
ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM, PATTERN FORMING METHOD, MANUFACTURING METHOD OF ELECTRONIC DEVICE AND ELECTRONIC DEVICE WHICH USE THE COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide: an actinic ray-sensitive or radiation-sensitive resin composition capable of forming a pattern that is excellent in the local pattern dimension uniformity (Local CDU) and exposure latitude (EL) and reduced in the generation of scum and residual water defect; and a pattern forming method, a resist film, a manufacturing method of an electronic device, and an electronic device which use the composition.SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition comprises: (A) a resin having a repeating unit represented by general formula (I); (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation; and (C) a resin having at least one repeating unit (x) out of a repeating unit represented by general formula (II) and a repeating unit represented by general formula (III) and containing substantially neither a fluorine atom nor a silicon atom, where the content of the repeating unit (x) is 90 mol% or more based on all repeating units in the resin (C). |
申请公布号 |
JP2015180950(A) |
申请公布日期 |
2015.10.15 |
申请号 |
JP20150104525 |
申请日期 |
2015.05.22 |
申请人 |
FUJIFILM CORP |
发明人 |
YAMAGUCHI SHUHEI;TAKAHASHI HIDETOMO;ITO JUNICHI;YAMAMOTO KEI |
分类号 |
G03F7/004;C08F220/10;C09K3/00;G03F7/038;G03F7/039;G03F7/32 |
主分类号 |
G03F7/004 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|