发明名称 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM, PATTERN FORMING METHOD, MANUFACTURING METHOD OF ELECTRONIC DEVICE AND ELECTRONIC DEVICE WHICH USE THE COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide: an actinic ray-sensitive or radiation-sensitive resin composition capable of forming a pattern that is excellent in the local pattern dimension uniformity (Local CDU) and exposure latitude (EL) and reduced in the generation of scum and residual water defect; and a pattern forming method, a resist film, a manufacturing method of an electronic device, and an electronic device which use the composition.SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition comprises: (A) a resin having a repeating unit represented by general formula (I); (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation; and (C) a resin having at least one repeating unit (x) out of a repeating unit represented by general formula (II) and a repeating unit represented by general formula (III) and containing substantially neither a fluorine atom nor a silicon atom, where the content of the repeating unit (x) is 90 mol% or more based on all repeating units in the resin (C).
申请公布号 JP2015180950(A) 申请公布日期 2015.10.15
申请号 JP20150104525 申请日期 2015.05.22
申请人 FUJIFILM CORP 发明人 YAMAGUCHI SHUHEI;TAKAHASHI HIDETOMO;ITO JUNICHI;YAMAMOTO KEI
分类号 G03F7/004;C08F220/10;C09K3/00;G03F7/038;G03F7/039;G03F7/32 主分类号 G03F7/004
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